Temperature dependence of current transport in palladium/LB-film/silicon diodes

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 652-654

  O'Beirn, B ^a   Casey, V ^a   Gubbins, M A ^a   McMonagle, J B ^a  

^a UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

Langmuir Blodgett films; Palladium; Silicon

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; LANGMUIR BLODGETT FILMS; PALLADIUM; SEMICONDUCTING SILICON; THERMAL EFFECTS; TUNNEL DIODES;

LOW FORWARD BIAS; REVERSE BIAS;

METAL INSULATOR BOUNDARIES;

EID: 11544297945     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00733-0     Document Type: Article

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