Robust design experiment to reduce variance components

Quality Engineering

Volumn 10, Issue 4, 1998, Pages 645-655

  Czitrom, Veronica ^{a,b,c,d,e,f,g}   Mohammadi, Parviz ^a,h,i,j   Flemming, Mike ^a,h,k,l,m,n   Dyas, Bob ^a,o  

^a NOKIA RESEARCH CENTER   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^e SEMATECH   (United States)

^f UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^g UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^h Cirent Semiconductor   (United States)

ⁱ UNIVERSITY OF CENTRAL FLORIDA   (United States)

^j AT and T   (United States)

^k KANSAS STATE UNIVERSITY   (United States)

^l STANFORD UNIVERSITY   (United States)

^m AT and T Microelectronics

ⁿ Kansas City Works   (United States)

^o Lincoln Technical Institute   (United States)

more..

Author keywords

Control charts; Full factorial design; Nested design

Indexed keywords

EID: 11544280547     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1080/08982119808919182     Document Type: Article

References (3)

1. Box, G. E. P., Hunter, W. G., and Hunter, S. J., Statistics for Experimenters, John Wiley & Sons, New York, 1978.
2. Mason, R. L., Gunst, R. F., and Hess, J. L., Statistical Design and Analysis of Experiments with Applications to Engineering and Science, John Wiley & Sons, New York, 1989.
3. Montgomery, D. C., Design and Analysis of Experiments, 3rd ed., John Wiley & Sons, New York, 1991.