Effect of thermal noise on the current-voltage characteristics of Josephson junctions

Modern Physics Letters B

Volumn 10, Issue 22, 1996, Pages 1095-1102

  Chattah, A K ^a   Briozzo, C B ^a   Osenda, O ^a   Caceres M O ^b  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^b DEPARTAMENTO DE FÍSICA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11544275067     PISSN: 02179849     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217984996001243     Document Type: Article

References (14)

1. V. Ambegaokar and B. I. Halperin, Phys. Rev. Lett. 22, 1364 (1969).
2. M. J. Stephen, Phys. Rev. 186, 393 (1969).
3. P. A. Lee, J. Appl. Phys. 42, 325 (1971).
4. R. Gupta, Q. Hu, D. Terpstra, G. Gerritsma, and H. Rogalla, Appl. Phys. Lett. 64, 927 (1994).
5. Josephson Effect - Achievements and Trends, ed. A. Barone (World Scientific, Singapore, 1986) ;
6. M. Russo, ibid., pp. 216-247.
7. J. P. Waldram, Rep. Prog. Phys. 39, 751 (1976).
8. B. Ya. Shapiro, I. Dayan, M. Gitterman, and G. Weiss, Phys. Rev. B46, 8349 (1992).
9. P. Russer, J. Appl. Phys. 43, 2008 (1972).
10. M. O. Cáceres, A. Becker, and L. Kramer, Phys. Rev. A43, 6581 (1991).
11. A. K. Chattah, C. B. Briozzo, M. O. Cáceres, and O. Osenda, Mod. Phys. Lett. B10, 1085 (1996).
12. N. G. van Kampen, Stochastic Processes in Physics and Chemistry (North-Holland, Amsterdam, 1981).
13. L. S. Schulman, Techniques and Applications of Path Integration (Wiley, New York, 1981).
14. L. L. Solm and M. Octavio, Phys. Rev. B49, 9236 (1994).