SFM and SEM investigation of CdS layers from Langmuir-Blodgett film templates

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 532-535

  Facci, Paolo ^a   Diaspro, Alberto ^b   Rolandi, Ranieri ^b  

^a UNIVERSITY OF PARMA   (Italy)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

Langmuir Blodgett films; Scanning electron microscopy; Scanning force microscopy

Indexed keywords

CRYSTAL LATTICES; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; ULTRATHIN FILMS;

BREWSTER ANGLE MICROSCOPY; CADMIUM SULFIDE; SCANNING FORCE MICROSCOPY (SFM);

LANGMUIR BLODGETT FILMS;

EID: 11544253864     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00704-4     Document Type: Article

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