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Volumn 286, Issue SPEC. ISS., 2005, Pages 463-467
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Antiphase boundaries induced exchange coupling in epitaxial Fe 3O 4 thin films
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Author keywords
Exchange bias; Grain boundaries; Magnetite; Thin epitaxial films
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Indexed keywords
EXCHANGE BIAS;
GROWTH DEFECTS;
SPINELECTRONIC APPLICATIONS;
THIN EPITAXIAL FILMS;
ANTIFERROMAGNETISM;
COOLING;
ELECTRONIC STRUCTURE;
GRAIN BOUNDARIES;
IRON COMPOUNDS;
MAGNETITE;
MAGNETOMETERS;
X RAY DIFFRACTION ANALYSIS;
THIN FILMS;
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EID: 11444253609
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmmm.2004.09.066 Document Type: Conference Paper |
Times cited : (46)
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References (13)
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