Complete characterization of arbitrary quantum measurement processes

Physical Review Letters

Volumn 83, Issue 18, 1999, Pages 3573-3576

  Luis, A ^a   Sanchez Soto L L ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11444253145     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.3573     Document Type: Article

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