A new approach in testing analog-to-digital converters

Informacije MIDEM

Volumn 34, Issue 3, 2004, Pages 135-140

  Kollár, Martin ^a  

^a TECHNICAL UNIVERSITY OF KO ICE   (Slovakia)

Author keywords

Differential non linearity; Integral non linearity; Testing ADC

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COMPUTER SOFTWARE; DIGITAL TO ANALOG CONVERSION; ELECTRONIC EQUIPMENT TESTING; ERROR ANALYSIS; VECTORS;

ADC TESTING; ANALOG-TO-DIGITAL CONVERTERS (ADC); DIFFERENTIAL NON-LINEARITY (DNL); INTEGRAL NON-LINEARITY (INL);

ANALOG TO DIGITAL CONVERSION;

EID: 11444249410     PISSN: 03529045     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. Kuyel, T.: Linearity Testing Issues of Analog to Digital Converters. IEEE International Test Conference, pp.747-756, 1999.
2. European project DYNAD.: Methods and Draft Standards for the Dynamic Characterization and Testing of Analog-to-Digital Converters, published on web at: htpp://www.fe.up.pt/~hsm/dynad
3. IEEE Std. 1057-1994. IEEE Standard for digitizing waveform recorders. The institute of electrical and electronics engineers, Inc. New York, USA, 1994, p.80.
4. Michaeli, L.: Modeling of Analog-to-Digital Interfaces. Mercury-Smékal Press, Košice, p.160, 2001, (In Slovak).