E-Pulse Diagnostics of Simple Layered Materials

IEEE Transactions on Antennas and Propagation

Volumn 51, Issue 12, 2003, Pages 3221-3227

  Stenholm, Garrett J ^a   Rothwell, Edward J ^a   Nyquist, Dennis P ^a   Kempel, Leo C ^a   Frasch, Lydell L ^b  

^a Michigan State University   (United States)

^b BOEING COMPANY   (United States)

Author keywords

Electromagnetic transient scattering; Nondestructive testing; Radar target recognition

Indexed keywords

ELECTRIC FIELDS; GAUSSIAN NOISE (ELECTRONIC); MATHEMATICAL TRANSFORMATIONS; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY; POLARIZATION; RADAR TARGET RECOGNITION; RESONANCE; SCATTERING;

ELECTROMAGNETIC TRANSIENT SCATTERING; LAYERED MATERIALS;

ELECTROMAGNETISM;

EID: 1142301894     PISSN: 0018926X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TAP.2003.820980     Document Type: Article

References (9)

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2. C. E. Baum, E. J. Rothwell, K. M. Chen, and D. P. Nyquist, "The singularity expansion method and its application to target identification, " Proc. IEEE, vol. 79, pp. 1481-1492, Oct. 1991.
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8. E. Rothwell, K. M. Chen, and D. P. Nyquist, "Extraction of the natural frequencies of a radar target from a measured response using E-pulse techniques." IEEE Trans. Antennas Propagat.,vol. AP-35, pp. 715-720, June 1987.
9. A. Leon-Garcia. Probability and Random Processes for Electrical Engineering. Reading, MA: Addison Wesley, 1994.