Photomodulated reflectance and transmittance: Optical characterisation of novel semiconductor materials and device structures

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 14-22

  Misiewicz, J ^a   Sek G ^a   Kudrawiec, R ^a   Sitarek, P ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Device structures; Fast Fourier transform; Photomodulation spectroscopy; Quantum dots; Quantum wells

Indexed keywords

DOPING (ADDITIVES); ELECTRIC FIELD EFFECTS; ENERGY GAP; FAST FOURIER TRANSFORMS; INDIUM COMPOUNDS; LIGHT EMITTING DIODES; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

DEVICE STRUCTURES; PHOTOMODULATION SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 1142279635     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.041     Document Type: Conference Paper

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