A XRD study of Co/Au multilayers using a laboratory microdiffractometer

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 183-186

  Bontempi, E ^a   Depero, L E ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

Author keywords

Multilayer; XRD; XRD2

Indexed keywords

DIFFRACTOMETERS; GOLD COMPOUNDS; MAGNETIC ANISOTROPY; MICROSTRUCTURE; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; STRUCTURAL ANALYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS; X-RAY MICRODIFFRACTION;

COBALT COMPOUNDS;

EID: 1142279623     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.068     Document Type: Conference Paper

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