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Volumn 403, Issue 1-2, 2004, Pages 25-31
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Measurement of magnetic relaxation in the peak regime of V3Si
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRYSTALS;
HYSTERESIS;
MAGNETIC FIELD EFFECTS;
MAGNETIC MOMENTS;
MAGNETIC RELAXATION;
MAGNETIZATION;
MAGNETOMETERS;
REGRESSION ANALYSIS;
SQUIDS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
VANADIUM COMPOUNDS;
FLUX CREEP;
HYSTERESIS LOOPS;
OSCILLATORY FIELDS;
SUPERCONDUCTING MATERIALS;
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EID: 1142276202
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physc.2003.11.004 Document Type: Article |
Times cited : (5)
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References (22)
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