Characterization of grain alignment in Si3N 4(w)/Si3N4 composites

Materials Letters

Volumn 58, Issue 10, 2004, Pages 1587-1592

  Zou, Linhua ^a,b   Park, Dong Soo ^b   Cho, Byung Uk ^b   Huang, Yong ^a   Kim, Hi Doo ^b  

^a TSINGHUA UNIVERSITY   (China)

^b Korea Institute of Machine and Materials   (South Korea)

Author keywords

Ceramics; Composite materials; X ray diffraction

Indexed keywords

BRITTLENESS; CERAMIC MATERIALS; COMPOSITE MATERIALS; CRACK PROPAGATION; CRYSTALLOGRAPHY; EXTRUSION; FRACTURE TOUGHNESS; HOT PRESSING; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

GRAIN ALIGNMENT; MICROSTRUCTURE ANALYSIS; POLE DENSITY;

SILICON NITRIDE;

EID: 1142268063     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.10.031     Document Type: Article

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