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Volumn 47, Issue 3, 2005, Pages 199-214

An address mapping approach for test data generation of dynamic linked structures

Author keywords

Linked structure; Software; Test data generation

Indexed keywords

LINKED STRUCTURES; STATEMENT EXECUTION; SYMBOLIC COMPUTATION; TEST DATA GENERATION;

EID: 11344290827     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2004.08.004     Document Type: Article
Times cited : (11)

References (20)
  • 11
    • 0001231257 scopus 로고    scopus 로고
    • An integrated automatic test data generation system
    • J. Offutt An integrated automatic test data generation system Journal of Systems Integration 1 3 1996 391 409
    • (1996) Journal of Systems Integration , vol.1 , Issue.3 , pp. 391-409
    • Offutt, J.1
  • 12
    • 0033077271 scopus 로고    scopus 로고
    • The dynamic domain reduction approach to test data generation
    • J. Offutt, Z. Jin, and J. Pan The dynamic domain reduction approach to test data generation Software-Practice and Experience 29 2 1999 167 193
    • (1999) Software-Practice and Experience , vol.29 , Issue.2 , pp. 167-193
    • Offutt, J.1    Jin, Z.2    Pan, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.