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Volumn 47, Issue 3, 2005, Pages 181-187

EC - A measurement based safer subset of ISO C suitable for embedded system development

Author keywords

Base subset; Embedded system; ISO C

Indexed keywords

BASE SUBSET; EMBEDDED CONTROL SYSTEMS; ISO C; PROBABILITY OF FAILURE ON DEMAND (PFD);

EID: 11344289816     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2004.08.001     Document Type: Article
Times cited : (5)

References (13)
  • 3
    • 1642309241 scopus 로고    scopus 로고
    • Safer Language Subsets: An overview and a case history, MISRA C
    • L. Hatton Safer Language Subsets: an overview and a case history, MISRA C Information and Software Technology 46 2004 465 472
    • (2004) Information and Software Technology , vol.46 , pp. 465-472
    • Hatton, L.1
  • 7
    • 1642284044 scopus 로고
    • Addison-Wesley Reading, MA
    • A. Koenig C Traps and Pitfalls 1988 Addison-Wesley Reading, MA ISBN 0-201-17928-8
    • (1988) C Traps and Pitfalls
    • Koenig, A.1
  • 9
    • 0031078267 scopus 로고    scopus 로고
    • Investigating the influence of formal methods
    • L. Pfleeger, and L. Hatton Investigating the influence of formal methods IEEE Computer 30 2 1997
    • (1997) IEEE Computer , vol.30 , Issue.2
    • Pfleeger, L.1    Hatton, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.