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Volumn 47, Issue 3, 2005, Pages 181-187
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EC - A measurement based safer subset of ISO C suitable for embedded system development
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Author keywords
Base subset; Embedded system; ISO C
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Indexed keywords
BASE SUBSET;
EMBEDDED CONTROL SYSTEMS;
ISO C;
PROBABILITY OF FAILURE ON DEMAND (PFD);
ALGORITHMS;
C (PROGRAMMING LANGUAGE);
COMPUTER PROGRAMMING;
COMPUTER SYSTEM RECOVERY;
CONTROL SYSTEMS;
SIGNAL TO NOISE RATIO;
SOFTWARE ENGINEERING;
EMBEDDED SYSTEMS;
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EID: 11344289816
PISSN: 09505849
EISSN: None
Source Type: Journal
DOI: 10.1016/j.infsof.2004.08.001 Document Type: Article |
Times cited : (5)
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References (13)
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