Single event transient effects in a voltage reference

Microelectronics Reliability

Volumn 45, Issue 2, 2005, Pages 355-359

  Adell, P C ^a   Schrimpf, R D ^a   Cirba, C R ^a   Holman, W T ^a   Zhu, X ^a   Barnaby, H J ^b   Mion, O ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b University of Arizona   (United States)

^c THALES ALENIA SPACE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT CALIBRATION; CIRCUIT SIMULATIONS; SINGLE EVENT TRANSIENTS (SET); VOLTAGE REFERENCE;

COMPUTER SIMULATION; FEEDBACK; HEAVY IONS; INTEGRATED CIRCUITS; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; TRANSISTORS; VOLTAGE CONTROL;

TRANSIENTS;

EID: 11344272398     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.05.029     Document Type: Conference Paper

References (8)

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3. A.H. Johnston, G.M. Swift, T.F. Miyahira, and L.D. Edmonds A model for single-event transients in comparators IEEE Trans. Nucl. Sci. 47 2000 2624 2633
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