New methods for depth profiling of heterostructures by X-ray diffraction

Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics

Volumn 19, Issue 2-4, 1997, Pages 321-328

  Moller M O ^a   Gerhard, T ^a   Re, H R ^a   Landwehr, G ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11344263323     PISSN: 03926737     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03040989     Document Type: Article

References (9)

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