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Volumn 391, Issue 1-2, 2005, Pages 337-341
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Fatigue notch sensitivity of ultrafine-grained copper
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Author keywords
Fatigue notch sensitivity; Stability of grain structure; Ultrafine grained copper
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Indexed keywords
BACKSCATTERING;
CRACKS;
CRYSTAL MICROSTRUCTURE;
ELECTRON DIFFRACTION;
ELECTRONS;
FATIGUE OF MATERIALS;
SENSITIVITY ANALYSIS;
ELECTRON BACKSCATTERING DIFFRACTION TECHNIQUE;
GRAIN COARSENING;
ULTRAFINE-GRAINED (UFG) COPPER;
COPPER;
COPPER;
FATIGUE;
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EID: 11244351776
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2004.09.052 Document Type: Article |
Times cited : (63)
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References (22)
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