Circuit self-recovery experiments in extreme environments

Proceedings - 2004 NASA/DoD Conference on Evolvable Hardware

Volumn , Issue , 2004, Pages 142-145

  Stoica, Adrian ^a   Keymeulen, Didier ^a   Arslan, Tughrul ^b   Duong, Vu ^a   Zebulum, Ricardo ^a   Ferguson, Ian ^a   Guo, Xin ^c  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF EDINBURGH   (United Kingdom)

^c Chromatech   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD PROGRAMMABLE TRANSISTOR ARRAY (FPTA); HALF WAVE RECTIFIERS; ROOM TEMPERATURE; SINGLE EVENT EFFECTS (SEE);

FIELD EFFECT TRANSISTORS; HARDWARE; LOW PASS FILTERS; MICROPROCESSOR CHIPS; NETWORKS (CIRCUITS); ROBUSTNESS (CONTROL SYSTEMS); SILICON ON INSULATOR TECHNOLOGY;

ELECTRONIC EQUIPMENT;

EID: 11244351667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2004.1310823     Document Type: Conference Paper

References (2)

1. J. Haslett, F. Trofimenkoff, I. Finvers, F. Sabouri, and R. Smallwood, "High Temperature Electronics Using Silicon Technology", 1996 IEEE Solid State Circuits Conf., pp. 402-403.
2. A. Stoica, R. Zebulum, M.I. Ferguson, D. Keymeulen, V. Duong, "Evolving Circuits in Seconds: Experiments with a Stand-Alone Board Level Evolvable System", pp. 67-74. 2002 NASA/DoD Conf. on Evolvable Hardware, Virginia, USA, July, 2002, IEEE Computer Society.