Success-driven learning in ATPG for preimage computation

IEEE Design and Test of Computers

Volumn 21, Issue 6, 2004, Pages 504-512

  Sheng, Shuo ^a   Hsiao, Michael S ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN FUNCTIONS; COMPUTABILITY AND DECIDABILITY; COMPUTATIONAL COMPLEXITY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIVALENCE CLASSES; INTEGRATED CIRCUIT LAYOUT; LEARNING ALGORITHMS; VLSI CIRCUITS;

BINARY DECISION DIAGRAMS; FORMAL VERIFICATION; PREIMAGE COMPUTATION; SEARCH STATE EQUIVALENCE; SUCCESS DRIVEN LEARNING ALGORITHM;

COMPUTER CIRCUITS;

EID: 11244321780     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2004.97     Document Type: Article

References (4)

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2. M. Abramovici, M.A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, 1990, pp. 203-209.
3. L. Zhang et al., "Efficient Conflict Driven Learning in a Boolean Satisfiability Solver," Proc. Int'l Conf. Computer-Aided Design (ICCAD 01), IEEE Press, 2001, pp. 279-285.
4. J.P. Marques Silva and K.A. Sakallah, "Dynamic Search-Space Pruning Techniques in Path Sensitization," Proc. 31st Design Automation Conf. (DAC 94), ACM Press, 1994, pp. 705-711.