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Volumn 337, Issue , 1999, Pages 277-280
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XPS, AFM and EIA studies of IgG molecules site-directed immobilized on APTES modified silicon wafer surfaces
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Author keywords
AFM; APTES; EIA; XPS
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Indexed keywords
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EID: 11244321504
PISSN: 1058725X
EISSN: None
Source Type: Journal
DOI: 10.1080/10587259908023431 Document Type: Article |
Times cited : (5)
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References (3)
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