Raman scattering studies of the GeS 2-Ga 2S 3-CsCl glassy system

Solid State Communications

Volumn 133, Issue 5, 2005, Pages 327-332

  Haizheng, Tao ^a   Xiujian, Zhao ^a   Chengbin, Jing ^a   Hui, Yang ^a   Shun, Mao ^a  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

A. CsCl; D. Micro structural units; D. Raman

Indexed keywords

CSCL; GLASSY SYSTEM; MICRO-STRUCTURAL UNITS; RAMAN;

GALLIUM COMPOUNDS; GLASS; MICROSTRUCTURE; NEGATIVE IONS; RAMAN SCATTERING; X RAY DIFFRACTION ANALYSIS;

GERMANIUM COMPOUNDS;

EID: 11244255119     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.11.010     Document Type: Article

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