Effects of Surface Roughness on Large-Volume CdZnTe Nuclear Radiation Detectors and Removal of Surface Damage by Chemical Etching

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5198, Issue , 2004, Pages 306-313

  Wright, G W ^a   Camarda, G ^a   Kakuno, E ^a   Li, L ^b   Lu, F ^b   Lee, C ^b   Burger, A ^c   Trombka, J ^d   Siddons, P ^a   James, R B ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b Yinnel Tech Inc   (United States)

^c FISK UNIVERSITY   (United States)

^d NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTROLESS PLATING; ETCHING; INTERFACES (MATERIALS); LEAKAGE CURRENTS; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; RADIATION DETECTORS; SINGLE CRYSTALS; SURFACE ROUGHNESS;

CHEMICAL ETCHING; NUCLEAR RADIATION DETECTORS;

CADMIUM COMPOUNDS;

EID: 11144355240     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.510180     Document Type: Conference Paper

References (9)

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