Measurement of the time-resolved X-ray emission of different elements irradiated with a subpicosecond high-power laser

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5196, Issue , 2004, Pages 205-212

  Chenais Popovics, C ^a   Audebert, P ^a   Nagels, V ^a   Geindre, J P ^a   Gauthier, J C ^a,b   Gary, S ^d   Girard, F ^c   Dorchies, F ^b   Shepherd, R ^d   Peyrusse, O ^b,c  

^a Centre National de la Recherche Scientifique   (France)

^b CENTRE LASERS INTENSES ET APPLICATIONS   (France)

^c CEA DIF   (France)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Frequency Domain Interferometry; Subpicosecond laser plasma; Time resolved X ray spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; CAMERAS; FREQUENCY DOMAIN ANALYSIS; HYDRODYNAMICS; INTERFEROMETRY; IRRADIATION; PLASMAS; X RAY SPECTROSCOPY;

FREQUENCY DOMAIN INTERFEROMETRY; SUBPICOSECOND LASER PLASMA; TIME-RESOLVED X-RAY SPECTROSCOPY;

LASER PULSES;

EID: 11144354763     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.507071     Document Type: Conference Paper

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