The EUV detector of the Cosmic Hot Interstellar Plasma Spectrometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5164, Issue , 2003, Pages 43-53

  Marckwordt, Mario ^a   Gaines, Geoffrey ^b   Edelstein, Jerry ^a   Hemphill, Richelieu ^a   Hull, Jeff ^a   Hurwitz, Mark ^a   Lampton, Michael ^a   McKee, Ken ^a   Sasseen, Timothy P ^c   Sholl, Michael ^a   Siegmund, Oswald ^a   Sirk, Martin ^a   Taylor, Ellen Riddle ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Gaines Systems   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d Design Net Engineering Group

Author keywords

CHIPS; Delayline; EUV; MCP detector; Thin film filter; UNEX; XDL

Indexed keywords

BANDPASS FILTERS; IMAGE ANALYSIS; METAL DETECTORS; PHOTOCATHODES; SPECTROMETERS; THIN FILMS;

CHIPS; CROSSED-DELAYLINE (XDL); DELAYLINE; EUV; MCP DETECTORS; UNEX;

SPACECRAFT INSTRUMENTS;

EID: 11144353775     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.512279     Document Type: Conference Paper

References (11)

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