메뉴 건너뛰기




Volumn 15, Issue 12, 2004, Pages 1771-1778

Atomic force microscopy tip noise induced by adhesion, nanoindentation and fracture

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DIAMONDS; FRACTURE; INDENTATION;

EID: 11144340373     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/12/014     Document Type: Article
Times cited : (8)

References (26)
  • 4
    • 0032090143 scopus 로고    scopus 로고
    • Molecular dynamics simulation of friction on the atomic scale
    • Shimizu J, Eda H, Yoritsune M and Ohmura E 1998 Molecular dynamics simulation of friction on the atomic scale Nanotechnology 9 118-23
    • (1998) Nanotechnology , vol.9 , pp. 118-123
    • Shimizu, J.1    Eda, H.2    Yoritsune, M.3    Ohmura, E.4
  • 6
    • 34347209835 scopus 로고
    • Calculation of thermal noise in atomic force microscopy
    • Butt H-J and Jaschke M 1995 Calculation of thermal noise in atomic force microscopy Nanotechnology 6 1-7
    • (1995) Nanotechnology , vol.6 , pp. 1-7
    • Butt, H.-J.1    Jaschke, M.2
  • 7
    • 0033873704 scopus 로고    scopus 로고
    • Quantitative determination of contact stiffness using atomic force acoustic microscopy
    • Rabe U, Amelio S, Kester E, Scherer V, Hirsekorn S and Arnold W 2000 Quantitative determination of contact stiffness using atomic force acoustic microscopy Ultrasonics 38 430-7
    • (2000) Ultrasonics , vol.38 , pp. 430-437
    • Rabe, U.1    Amelio, S.2    Kester, E.3    Scherer, V.4    Hirsekorn, S.5    Arnold, W.6
  • 8
    • 4243519048 scopus 로고    scopus 로고
    • Measurements of stiff-material compliance on the nanoscale using ultrasonics force microscopy
    • Dinelli F, Biswas S K, Briggs G A D and Kolosov O V 2000 Measurements of stiff-material compliance on the nanoscale using ultrasonics force microscopy Phys. Rev. B 61 13995-4006
    • (2000) Phys. Rev. B , vol.61 , pp. 13995-14006
    • Dinelli, F.1    Biswas, S.K.2    Briggs, G.A.D.3    Kolosov, O.V.4
  • 10
    • 0001173529 scopus 로고
    • Tapping-mode atomic microscopy and phase-imaging in higher eigenmodes
    • Stark R W, Drobek T and Heckl W M 1993 Tapping-mode atomic microscopy and phase-imaging in higher eigenmodes Appl. Phys. Lett. 74 3296-8
    • (1993) Appl. Phys. Lett. , vol.74 , pp. 3296-3298
    • Stark, R.W.1    Drobek, T.2    Heckl, W.M.3
  • 12
    • 0000185958 scopus 로고    scopus 로고
    • Array-enhanced friction in the periodic stick-slip motion of nonlinear oscillators
    • Rapid Communications
    • Braiman Y, Family F and Hentschel H G E 1996 Array-enhanced friction in the periodic stick-slip motion of nonlinear oscillators Phys. Rev. E 53 R3005-8 (Rapid Communications)
    • (1996) Phys. Rev. E , vol.53
    • Braiman, Y.1    Family, F.2    Hentschel, H.G.E.3
  • 15
    • 84934701192 scopus 로고
    • Hertz H 1882 J. Reine. Angew. Math. 92 156 also in Hertz H 1896 Miscellaneous Papers (London: Macmillan) p 146 see review by Johnson K L 1982 Proc. Inst. Mech. Eng. 196 363
    • (1882) J. Reine. Angew. Math. , vol.92 , pp. 156
    • Hertz, H.1
  • 16
    • 0004099368 scopus 로고
    • London: Macmillan
    • Hertz H 1882 J. Reine. Angew. Math. 92 156 also in Hertz H 1896 Miscellaneous Papers (London: Macmillan) p 146 see review by Johnson K L 1982 Proc. Inst. Mech. Eng. 196 363
    • (1896) Miscellaneous Papers , pp. 146
    • Hertz, H.1
  • 17
    • 0000338577 scopus 로고
    • Hertz H 1882 J. Reine. Angew. Math. 92 156 also in Hertz H 1896 Miscellaneous Papers (London: Macmillan) p 146 see review by Johnson K L 1982 Proc. Inst. Mech. Eng. 196 363
    • (1982) Proc. Inst. Mech. Eng. , vol.196 , pp. 363
    • Johnson, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.