HIDA databank - Its development and future

International Journal of Pressure Vessels and Piping

Volumn 78, Issue 11-12, 2001, Pages 1031-1042

  Concari, S ^a   Fairman, A ^b  

^a ENEL   (Italy)

^b ERA TECHNOLOGY LTD   (United Kingdom)

Author keywords

Component cracking failure in high temperature plant; Creep and fatigue crack growth data; Graphical user interface (GUI); HIDA databank; High temperature defect assessment; Knowledge based system (KBS)

Indexed keywords

EID: 11144307473     PISSN: 03080161     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0308-0161(01)00120-X     Document Type: Article

References (2)

1. Fedeli G. A survey of European industrial experience within the HIDA project. Mater High Temp 1998;15(3-4):239-42.
2. Al-Abed B, Shibli IA. Scatter bands in creep and fatigue crack growth rates in high temperature plants materials data. Mater High Temp 1998;15(3-4):143-9.