Variation in parameters related to leaf thickness in common bean (Phaseolus vulgaris L.)

Field Crops Research

Volumn 91, Issue 1, 2005, Pages 7-21

  White, Jeffrey W ^a   Montes R , Consuelo ^b  

^a U S WATER CONSERVATION LABORATORY   (United States)

^b UNIVERSIDAD DEL CAUCA   (Colombia)

Author keywords

Common bean; Leaf specific mass; Leaf thickness; Specific leaf area

Indexed keywords

DENSITY (OPTICAL); FORESTRY; MICROMETERS; PLANTS (BOTANY); SEED; THICKNESS MEASUREMENT;

CULTIVARS; LEAF THICKNESS; LIGHT INTERCEPTION; MESOAMERICAN GENEPOOL;

CROPS;

ASSIMILATION EFFICIENCY; CARBON; LEAF AREA; LEAF MORPHOLOGY; LEGUME;

CERATONIA; FOREST CANOPY; FORESTRY; MICROMETERS; OPTICAL DENSITY; PLANTS; SEEDS; THICKNESS;

COLOMBIA; SOUTH AMERICA; WESTERN HEMISPHERE; WORLD;

PHASEOLUS (ANGIOSPERM); PHASEOLUS VULGARIS;

EID: 11144303648     PISSN: 03784290     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.fcr.2004.05.001     Document Type: Article

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