IRIS: An infra-red tilt sensor for the VLTI

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5491, Issue PART 2, 2004, Pages 944-953

  Gitton, Philippe ^a   Lévêque, Samuel ^a   Avila, Gerardo ^a   Duc, Thanh Phan ^a  

^a EUROPEAN SOUTHERN OBSERVATORY   (Germany)

Author keywords

Infra red; Tip tilt; VLTI

Indexed keywords

ERROR ANALYSIS; IMAGE SENSORS; INTERFEROMETERS; OPTICAL TELESCOPES; TRACKING (POSITION); WAVEFRONTS;

FRINGE CRACKERS; INFRARED IMAGE SENSOR (IRIS); TIP-TILT; VERY LARGE TELESCOPE INTERFEROMETRY (VLTI);

SENSORS;

EID: 11144302151     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.551377     Document Type: Conference Paper

References (2)

1. A. Glindemann et al, "VLTI technical advances - present and future", These proceedings, 2004
2. S.Leveque et al, "Towards nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI", Proc of SPIE, vol 4838, 2002.