Pattern classification of nevus with texture analysis

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings

Volumn 26 II, Issue , 2004, Pages 1459-1462

  Tanaka, T ^a   Torii, S ^a   Kabuta, I ^a   Shimizu, K ^a   Tanaka, M ^a   Oka, H ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

Nevus; Pattern classification; Texture analysis

Indexed keywords

CLASSIFICATION (OF INFORMATION); COMPUTATIONAL METHODS; IMAGE ANALYSIS; NEUROLOGY; PATIENT TREATMENT; STATISTICAL METHODS; TUMORS;

DERMAL NEVUS; MELANOMA; NEVUS; TEXTURE ANALYSIS;

PATTERN RECOGNITION;

EID: 11144302038     PISSN: 05891019     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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