Elastic and electromechanical properties of new ferroelectric-semiconductor materials of Sn2P2S6 family

Ferroelectrics

Volumn 257, Issue 1, 2001, Pages 113-122

  Samulionis, V ^a   Banys, J ^a   Vysochanskii, Yu ^b   Cajipe, V ^c  

^a VILNIUS UNIVERSITY   (Lithuania)

^b Uzhgorod University   (Ukraine)

^c INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

acoustoelectric interaction; ferroelectrics; phase transitions; piezoelectric measurements; ultrasonic

Indexed keywords

ACOUSTO-ELECTRIC; ACOUSTOELECTRIC INTERACTION; CRYSTALLINE PLATES; ELECTROMECHANICAL COUPLING COEFFICIENTS; ELECTROMECHANICAL COUPLING PARAMETER; ELECTROMECHANICAL PROPERTY; FERROELECTRIC PHASE; FERROELECTRICS; PARAELECTRIC PHASE; PIEZO-ELECTRIC EFFECTS; PIEZOELECTRIC COUPLINGS; PIEZOELECTRIC MEASUREMENTS; PIEZOELECTRIC PROPERTY; RESONANCE METHODS; ULTRASONIC INVESTIGATIONS;

ELECTROMECHANICAL COUPLING; ELECTROMECHANICAL DEVICES; FERROELECTRIC MATERIALS; FERROELECTRICITY; PHASE TRANSITIONS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SEMICONDUCTOR MATERIALS; TIN; ULTRASONICS;

SINGLE CRYSTALS;

EID: 11144297218     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190108016289     Document Type: Conference Paper

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