Equivalent circuits for air ionizers used in static control

Journal of Electrostatics

Volumn 61, Issue 2, 2004, Pages 71-83

  Crowley, Joseph M ^a   Leri, Dennis ^b   Dahlhoff, Geof ^b   Levit, Larry ^b  

^a Electrostatic Applications   (United States)

^b Ion Systems   (United States)

Author keywords

Circuit model; Ionizers; Neutralization; Static control

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; IONIZATION; LIQUID CRYSTAL DISPLAYS; MATHEMATICAL MODELS; NETWORKS (CIRCUITS);

CHARGED-PLATE METHOD; EXPONENTIAL DECAY LAW; SATURATION CURRENT; STATIC CONTROL;

ELECTROSTATICS;

ELECTROSTATICS;

EID: 11144276314     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2003.11.006     Document Type: Article

References (5)

1. ANSI-EOS/ESD-S3.1-1991, ESD Association standards for the protection of electrostatic discharge susceptible items: Ionization, ESD Association, Rome, New York, January 20, 1994.
2. ANSI-EOS/ESD-S4.1-1997, ESD Association standards for the protection of electrostatic discharge susceptible items: Worksurfaces-resistance measurements, ESD Association, Rome, New York, January 20, 1994.
3. L.B. Levit, G.G. Desai, W. Vosteen, Measurement of ionizer performance-a new approach, in: Electrostatic Overstress/Electrostatic Discharge Symposium Proceedings, 1999, pp. 124-129.
4. J.M. Crowley, S.A. Halperin, Resistance testing of static dissipative worksurfaces, in: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1988, pp. 84-91.
5. J.M. Crowley, A. Ignatenko, L. Levit, Biased-plate characterization of pulsed DC ionizers, in: Electrostatic Overstress/Electrostatic Discharge Symposium Proceedings, 2003, in press.