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Volumn 96, Issue 12, 2004, Pages 7018-7021

Optical properties of correlation-induced paramagnetic FeAl alloy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; FERMI LEVEL; NICKEL COMPOUNDS; PARAMAGNETIC MATERIALS; PARAMAGNETISM; PROBABILITY DENSITY FUNCTION; SPECTRUM ANALYSIS; THIN FILMS;

EID: 11144245226     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1810639     Document Type: Article
Times cited : (7)

References (21)
  • 2
    • 0000842744 scopus 로고    scopus 로고
    • Y. P. Lee et al., Phys. Rev. B 59, 546 (1999); J. Y. Rhee et al., Jpn. J. Appl. Phys., Part 1 38, 6401 (1999); J. Y. Rhee et al., ibid. 41, 2074 (2002); Y. P. Lee et al., J. Appl. Phys. 91, 4364 (2002); K. W. Kim et al., J. Korean Phys. Soc. 35, S165 (1999).
    • (1999) Phys. Rev. B , vol.59 , pp. 546
    • Lee, Y.P.1
  • 3
    • 0033345689 scopus 로고    scopus 로고
    • Y. P. Lee et al., Phys. Rev. B 59, 546 (1999); J. Y. Rhee et al., Jpn. J. Appl. Phys., Part 1 38, 6401 (1999); J. Y. Rhee et al., ibid. 41, 2074 (2002); Y. P. Lee et al., J. Appl. Phys. 91, 4364 (2002); K. W. Kim et al., J. Korean Phys. Soc. 35, S165 (1999).
    • (1999) Jpn. J. Appl. Phys., Part 1 , vol.38 , pp. 6401
    • Rhee, J.Y.1
  • 4
    • 0036529510 scopus 로고    scopus 로고
    • Y. P. Lee et al., Phys. Rev. B 59, 546 (1999); J. Y. Rhee et al., Jpn. J. Appl. Phys., Part 1 38, 6401 (1999); J. Y. Rhee et al., ibid. 41, 2074 (2002); Y. P. Lee et al., J. Appl. Phys. 91, 4364 (2002); K. W. Kim et al., J. Korean Phys. Soc. 35, S165 (1999).
    • (2002) Jpn. J. Appl. Phys., Part 1 , vol.41 , pp. 2074
    • Rhee, J.Y.1
  • 5
    • 0036537350 scopus 로고    scopus 로고
    • Y. P. Lee et al., Phys. Rev. B 59, 546 (1999); J. Y. Rhee et al., Jpn. J. Appl. Phys., Part 1 38, 6401 (1999); J. Y. Rhee et al., ibid. 41, 2074 (2002); Y. P. Lee et al., J. Appl. Phys. 91, 4364 (2002); K. W. Kim et al., J. Korean Phys. Soc. 35, S165 (1999).
    • (2002) J. Appl. Phys. , vol.91 , pp. 4364
    • Lee, Y.P.1
  • 6
    • 0033412584 scopus 로고    scopus 로고
    • Y. P. Lee et al., Phys. Rev. B 59, 546 (1999); J. Y. Rhee et al., Jpn. J. Appl. Phys., Part 1 38, 6401 (1999); J. Y. Rhee et al., ibid. 41, 2074 (2002); Y. P. Lee et al., J. Appl. Phys. 91, 4364 (2002); K. W. Kim et al., J. Korean Phys. Soc. 35, S165 (1999).
    • (1999) J. Korean Phys. Soc. , vol.35
    • Kim, K.W.1


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