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Volumn 367, Issue , 2001, Pages 143-150

Ellipsometry studies of 3D orientational structures in thin liquid crystal layers

Author keywords

Director distribution; Ellipsometry; Liquid crystal

Indexed keywords


EID: 11144226577     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250108028632     Document Type: Article
Times cited : (5)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.