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Volumn 367, Issue , 2001, Pages 143-150
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Ellipsometry studies of 3D orientational structures in thin liquid crystal layers
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Author keywords
Director distribution; Ellipsometry; Liquid crystal
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Indexed keywords
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EID: 11144226577
PISSN: 1058725X
EISSN: None
Source Type: Journal
DOI: 10.1080/10587250108028632 Document Type: Article |
Times cited : (5)
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References (10)
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