A neural network approach for software defects fix effort estimation

Proceedings of the Eigtht IASTED International Conference on Software Engineering and Applications

Volumn , Issue , 2004, Pages 513-517

  Zeng, Hui ^a   Rine, David ^a  

^a Krasnow Institute for Advanced Study   (United States)

Author keywords

Defects fix effort; Neural networks; Self Organizing Map (SOM); Software process metric

Indexed keywords

CONTRACTS; FINANCE; NEURAL NETWORKS; PARAMETER ESTIMATION; PROJECT MANAGEMENT; QUALITY ASSURANCE;

DEFECTS FIX EFFORT; SELF ORGANIZING MAP (SOM); SOFTWARE DEFECTS; SOFTWARE PROCESS METRIC;

COMPUTER SOFTWARE;

EID: 11144226395     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. A. Mockus, D. Weiss, and P. Zhang, Understanding and Predicting Effort in Software Projects, 25th International Conference on Software Engineering. May 03-10, 2003
2. B. Boehm, B. Clark, E. Horowitz, and et al. Cost models for future software life cycle processes: COCOMO 2.0. Annals of Software Engineering, November 1995.
3. K. Manzoor, A Practical Approach to Estim Defect-fix Time, http://homepages.com.pk/kashman/defectsEstimation.htm
4. M. R. Lyu, Handbook of Software Reliability Engineering(McGraw Hill, 1996).
5. T. Menzies and R. Lutz, Better Analysis of Defect Data at NASA, The 15th Intn'l Conf. on Software Engineering and Knowledge Engineering, July, 2003.
6. NASA Metrics Data Program Site http://mdp.ivv.nasa.gov/
7. T. Kohonen, The Self-Organizing Maps, Proceedings of the IEEE, 1990 78, 1464-1480
8. P.D. Heerman, Classification of multispetral remote sensing data using a batch propagation neural network, IEEE Trans, Geosci. Remote Sensing, 1992,
9. J.B. Dabney, and G. Barber, Computing direct return on investment for software independent verification and validation, NASA IV&V Facility, Fairmont, WV, 2003
10. S. Chulani, Bayesian Analysis of Software Cost and Quality Models, Ph.D Dissertation, Univ. of South California, 1999
11. R. Kennedy, Y. Lee, Solving Data Mining Problems through Pattern Recognition(Prentice Hall, 1997)