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Volumn 85, Issue 22, 2004, Pages 5173-5175
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Transmittance of a tunable filter at terahertz frequencies
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
ELECTRIC FIELDS;
ELECTROMAGNETISM;
METALLIZING;
MICROMACHINING;
POLARIZATION;
SENSITIVITY ANALYSIS;
SILICON WAFERS;
LATERAL SHIFT;
PHOTONIC CRYSTAL FILTERS;
TERAHERTZ FREQUENCIES;
TUNABLE FILTERS;
CRYSTALLINE MATERIALS;
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EID: 11044239241
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1829798 Document Type: Article |
Times cited : (75)
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References (13)
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