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Volumn 87, Issue 12, 2004, Pages 62-71

Construction of a fault-tolerant voter for N-modular redundancy

Author keywords

ADR; Duplex system; Majority voter; N modular redundancy system; TMR

Indexed keywords

DATA ACQUISITION; DECODING; ENCODING (SYMBOLS); ERROR DETECTION; LOGIC CIRCUITS; REDUNDANCY; RELIABILITY; SYSTEMS ANALYSIS;

EID: 11044238825     PISSN: 8756663X     EISSN: None     Source Type: Journal    
DOI: 10.1002/ecjb.20136     Document Type: Article
Times cited : (4)

References (9)
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    • Mori, H.1    Kambara, J.2
  • 2
    • 11044237393 scopus 로고
    • Fault tolerant computer system using new voting pattern
    • Kanagawa N, et al. Fault tolerant computer system using new voting pattern. Trans IEICE 1990;J73-D-I:109-116.
    • (1990) Trans. IEICE , vol.J73-D-I , pp. 109-116
    • Kanagawa, N.1
  • 3
    • 0003752179 scopus 로고
    • Fault tolerant computers
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    • (1991)
    • Nanya, T.1
  • 4
    • 0017937233 scopus 로고
    • Error correction by alternate-data retry
    • Shedletsky JJ. Error correction by alternate-data retry. IEEE Trans Comput 1978;27:106-112.
    • (1978) IEEE Trans. Comput. , vol.27 , pp. 106-112
    • Shedletsky, J.J.1
  • 5
    • 11044238230 scopus 로고
    • Design of ALU using error-correctable checksum code based on temporal redundancy
    • Kotani K et al. Design of ALU using error-correctable checksum code based on temporal redundancy. Trans IEICE 1983;J66-D:243-250.
    • (1983) Trans. IEICE , vol.J66-D , pp. 243-250
    • Kotani, K.1
  • 6
    • 5844242925 scopus 로고
    • Fault tolerant circuit based on ADR
    • Hasegawa Y, Naito A. Fault tolerant circuit based on ADR. Trans IEICE 1983;J66-D:198-205.
    • (1983) Trans. IEICE , vol.J66-D , pp. 198-205
    • Hasegawa, Y.1    Naito, A.2
  • 7
    • 11044219736 scopus 로고    scopus 로고
    • Masking double faults in combinatorial circuits using temporal redundancy and Hamming code
    • Tech Rep IEICE; FTS97-45
    • Yoshida T. Masking double faults in combinatorial circuits using temporal redundancy and Hamming code. Tech Rep IEICE 1997;FTS97-45.
    • (1997)
    • Yoshida, T.1
  • 8
    • 5844292705 scopus 로고
    • Design of fault-free combinatorial circuit using ADR
    • Naito A, Fujinawa O. Design of fault-free combinatorial circuit using ADR. Trans IEICE 1986;J69-D:1154-1164.
    • (1986) Trans. IEICE , vol.J69-D , pp. 1154-1164
    • Naito, A.1    Fujinawa, O.2
  • 9
    • 11044231415 scopus 로고    scopus 로고
    • Design of high-reliability voter using ADR
    • Takaesu T, Yoshida T. Design of high-reliability voter using ADR. Tech Rep IEICE 1999;FTS99-38.
    • (1999) Tech. Rep. IEICE , vol.FTS99-380
    • Takaesu, T.1    Yoshida, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.