True Young modulus of Pb(Zr,Ti)O3 films measured by nanoindentation

Applied Physics Letters

Volumn 85, Issue 22, 2004, Pages 5185-5187

  Delobelle, P ^a   Guillon, O ^a   Fribourg Blanc, E ^b   Soyer, C ^b   Cattan, E ^b   Remiens D ^b  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b UNIVERSITÉ DE VALENCIENNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; DEPOSITION; ELASTIC MODULI; FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; MECHANICAL PROPERTIES; MONITORING;

BULK CERAMICS; HIGH PRESSURE MODULUS; NANOINDENTATION; STIFFNESS MEASUREMENT;

THIN FILMS;

EID: 11044233461     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1827331     Document Type: Article

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