Emission of an Intense large area electron beam from a slab of porous dielectric

Journal of Applied Physics

Volumn 96, Issue 12, 2004, Pages 7714-7722

  Friedman, M ^a,b   Myers, M ^a   Hegeler, F ^a,b   Swanekamp, S B ^a,c   Wolford, M F ^a,d   Sethian, J D ^a   Ludeking, L ^a,e  

^a NAVAL RESEARCH LABORATORY   (United States)

^b CTI   (United States)

^c TITAN CORPORATION   (United States)

^d SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^e MRC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIODE IMPEDANCE; ELECTRON BEAM EMISSION; POROUS DIELECTRICS; PULSE SHAPE;

ANODES; CATHODES; CERAMIC MATERIALS; CURRENT DENSITY; DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTRIC IMPEDANCE; ELECTRON EMISSION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BEAMS;

EID: 11044231987     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1815050     Document Type: Article

References (17)

1. J. D. Sethian, S. P. Obenschain, K. A. Gerber et al., Rev. Sci. Instrum. 68, 2357 (1997).
2. R. B. Miller, J. Appl. Phys. 84, 3880 (1988). Velvet material comes with different grades. The one we used is called "Eagle Brand double velvet" and start to emit at electric field of 15 kV/cm. Different velvet brands have higher electric field threshold for emission. 3 See, for example, G. A. Mesyats, Explosive electron emission (URO, Ekaterinburg, 1988).
3. R. B. Miller, J. Appl. Phys. 84, 3880 (1988). Velvet material comes with different grades. The one we used is called "Eagle Brand double velvet" and start to emit at electric field of 15 kV/cm. Different velvet brands have higher electric field threshold for emission. 3 See, for example, G. A. Mesyats, Explosive electron emission (URO, Ekaterinburg, 1988).
4. Time dependent 3D fully electromagnetic particle-in-cell simulation (PIC)-"MAGIC." B. Goplen, L. Ludeking, D. Smithe, and G. Warren, Comput. Phys. Commun. 87, 54 (1995). When it was used to simulate a single ceramic pore the cell sizes were small enough to resolve the the smallest characteristic lengths (e.g., beamlet diameter, ceramic wall thickness, etc.).
5. Y. E. Krasik, A. Dunaevsky, and J. Felsteiner, Phys. Plasmas 8, 2466 (2001), see Fig. 2(a).
6. J. D. Sethian, M. Myers, I. D. Smith et al., IEEE Trans. Plasma Sci. 28, 1333 (2000).
7. T. M. Antosen, Jr., W. H. Miner, E. Ott, and A. T. Drobot, Phys. Fluids 27, 1257 (1984).
8. F. Hegeler, M. Friedman, M. C. Myers, J. D. Sethian, and S. B. Swanekamp, Phys. Plasmas 9, 4309 (2002).
9. M. Friedman, M. Myers, S. B. Swanekamp, F. Hegeler, and J. D. Sethian, Appl. Phys. Lett. 82, 179 (2003).
10. See, for example, http://www.superiortechceramics.com/materials/ cordierite.shtml
11. V. Baglin, Y. Bozhko, O. Grobner, B. Henrist, N. Hilleret, C. Scheueriein, and M. Taborelli, CERN CLIC Structure Working Group-Secondary Electron Emission (unpublished), http://clic-structures-working-group.web.cern. ch/clic-structures-working-group/min/2000/18-9-2000/noel.pdf
12. K. C. Humpherys and A. D. Kantz, IEEE Trans. Nucl. Sci. 26, 1784 (1979).
13. K. Sohlberg, S. J. Pennycook, and S. T. Pantelides, J. Am. Chem. Soc. 121, 7493 (1999).
14. M. Friedman, S. Swanekamp, S. Obenschain, Y. Chan, L. Ludeking, and D. Smithe, Appl. Phys. Lett. 77, 1053 (2000).
15. M. Friedman, M. Myers, S. B. Swanekamp, Y. Chan, and J. D. Sethian, Appl. Phys. Lett. 81, 1597 (2002).
16. M. Friedman, Y. Chan, S. Obenschain, J. D. Sethian, and S. B. Swanekamp, Appl. Phys. Lett. 83, 1539 (2003).
17. R. E. Collin, Foundations for Microwave Engineering, 2nd ed. (McGraw-Hill, New York, 1992).