메뉴 건너뛰기




Volumn 118, Issue 12, 1996, Pages 2950-2953

Understanding the relationship between surface coverage and molecular orientation in polar self-assembled monolayers

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR STRUCTURE; OPTICAL VARIABLES MEASUREMENT; SECOND HARMONIC GENERATION; SURFACES; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

EID: 11044228434     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja9528590     Document Type: Article
Times cited : (75)

References (18)
  • 6
    • 11044220333 scopus 로고
    • Frontiers in Materials Science
    • (f) Koshland, D. E., Jr. Frontiers in Materials Science. In Science 1992, 255, 1098, special issue devoted to Self-Assembly and Biomaterials - Biomimetics, and references therein.
    • (1992) Science , vol.255 , pp. 1098
    • Koshland Jr., D.E.1
  • 17
    • 0029270934 scopus 로고
    • For indirect observation of SAM and the surface native oxide layer on silicon, sec the following: (a) Shin, H.; Collins, R. J.; De Guire, M. R.; Heuer, A. H.; Sukenik, C. N. J. Mater. Res. 1995, 10(3), 692-8. (b) Shin, H.; Collins, R. J.; De Guire, M. R.; Heuer, A. H.; Sukenik, C. N. J. Mater. Res. 1995, 10(3), 699-703.
    • (1995) J. Mater. Res. , vol.10 , Issue.3 , pp. 692-698
    • Shin, H.1    Collins, R.J.2    De Guire, M.R.3    Heuer, A.H.4    Sukenik, C.N.5
  • 18
    • 0029271017 scopus 로고
    • For indirect observation of SAM and the surface native oxide layer on silicon, sec the following: (a) Shin, H.; Collins, R. J.; De Guire, M. R.; Heuer, A. H.; Sukenik, C. N. J. Mater. Res. 1995, 10(3), 692-8. (b) Shin, H.; Collins, R. J.; De Guire, M. R.; Heuer, A. H.; Sukenik, C. N. J. Mater. Res. 1995, 10(3), 699-703.
    • (1995) J. Mater. Res. , vol.10 , Issue.3 , pp. 699-703
    • Shin, H.1    Collins, R.J.2    De Guire, M.R.3    Heuer, A.H.4    Sukenik, C.N.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.