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Volumn 20, Issue 8, 2004, Pages 777-786
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Generalized linear model-based control charts for discrete semiconductor process data
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Author keywords
Generalized linear model; Model based control chart; Overdispersion
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Indexed keywords
DATA PROCESSING;
FUNCTIONS;
MULTIVARIABLE CONTROL SYSTEMS;
POISSON DISTRIBUTION;
RANDOM PROCESSES;
REGRESSION ANALYSIS;
DATA SETS;
GENERALIZED LINEAR MODEL;
MODEL-BASED CONTROL CHART;
OVERDISPERSION;
SEMICONDUCTOR MATERIALS;
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EID: 11044226732
PISSN: 07488017
EISSN: None
Source Type: Journal
DOI: 10.1002/qre.603 Document Type: Article |
Times cited : (42)
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References (12)
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