In-flight observations of long-term single-event effect (SEE) performance on Orbview-2 solid state recorders (SSR)

IEEE Radiation Effects Data Workshop

Volumn 2003-January, Issue , 2003, Pages 102-107

  Poivey, C ^a   Barth, J L ^b   LaBel, K A ^b   Gee, G ^a   Safren, H ^b  

^a SGT INC   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NASA; RADIATION HARDENING;

ENVIRONMENT MODELS; FLIGHT DATA; GROUND TESTS; SEU RATES; SINGLE EVENT EFFECTS; SINGLE EVENT UPSETS; SOLID STATE RECORDERS;

RADIATION EFFECTS;

EID: 11044225974     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281357     Document Type: Conference Paper

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