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Volumn 51, Issue 6 II, 2004, Pages 3816-3821

Total dose effects in a linear voltage regulator

Author keywords

Bias circuitry; Dynamic output range; Linear voltage regulator; Total dose

Indexed keywords

AMPLIFIERS (ELECTRONIC); ATTENUATION; COSTS; DIGITAL CIRCUITS; ELECTRIC CURRENT REGULATORS; ELECTRIC IMPEDANCE;

EID: 11044224129     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839194     Document Type: Conference Paper
Times cited : (50)

References (6)
  • 2
    • 0031367388 scopus 로고    scopus 로고
    • A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
    • Dec.
    • R. L. Pease, L. M. Cohn, D. M. Fleetwood, M. A. Gehlhausen, T. L. Turflinger, D. B. Brown, and A. H. Johnston, "A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment," IEEE Trans. Nucl. Sci., vol. 44, pp. 1981-1988, Dec. 1997.
    • (1997) IEEE Trans. Nucl. Sci. , vol.44 , pp. 1981-1988
    • Pease, R.L.1    Cohn, L.M.2    Fleetwood, D.M.3    Gehlhausen, M.A.4    Turflinger, T.L.5    Brown, D.B.6    Johnston, A.H.7
  • 3
    • 0034432498 scopus 로고    scopus 로고
    • The effects of space radiation on linear integrated circuits
    • Mar. 18-25
    • A. H. Johnston and S. M. Guertin, "The effects of space radiation on linear integrated circuits," in Proc. IEEE Aerospace Conf., vol. 5, Mar. 18-25, 2000, pp. 363-369.
    • (2000) Proc. IEEE Aerospace Conf. , vol.5 , pp. 363-369
    • Johnston, A.H.1    Guertin, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.