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Volumn 614, Issue 1 I, 2004, Pages 508-517
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New spectral classification technique for x-ray sources: Quantile analysis
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Author keywords
Methods: Statistical; X rays: General
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Indexed keywords
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EID: 10844292550
PISSN: 0004637X
EISSN: 15384357
Source Type: Journal
DOI: 10.1086/423445 Document Type: Article |
Times cited : (97)
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References (9)
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