GaAs arrays for X-ray spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5501, Issue , 2004, Pages 241-248

  Owens, Alan ^a   Andersson, H ^b   Campbell, M ^c   Lumb, D ^a   Nenonen, S ^b   Tlustos, L ^c  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b Oxford Instruments Analytical Oy   (Finland)

^c CERN   (Switzerland)

Author keywords

Compound semiconductors; GaAs; X ray arrays

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ARRAYS; ASTROPHYSICS; GALLIUM COMPOUNDS; LABORATORIES; POISSON RATIO; REMOTE CONTROL; SEMICONDUCTOR MATERIALS;

COMPOUND SEMICONDUCTORS; REMOTE SENSING APPLICATIONS; X-RAY ARRAYS; X-RAY IMAGING;

X RAY SPECTROSCOPY;

EID: 10844288829     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.552930     Document Type: Conference Paper

References (8)

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6. G. Bardelloni, et al., IEEE Trans. Nucl. Sci., Symp. Med. Imaging Conf., 12 (2000) 57.
7. B. Mikulec, et al., Nucl. Instr. & Meth., A458 (2001) 352.
8. K. Pfeiffer, et al., Nucl. Instr. & Meth., A509 (2003) 340.