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Volumn 78, Issue 1, 2005, Pages 1-4

Measurement of silicon and GaAs/Ge solar cells ac parameters

Author keywords

Ac parameters; Si and GaAs Ge solar cells; Temperature

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; PARAMETER ESTIMATION; SEMICONDUCTING GALLIUM ARSENIDE; SILICON; THERMAL EFFECTS; TIME DOMAIN ANALYSIS;

EID: 10844285302     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2004.07.002     Document Type: Article
Times cited : (14)

References (7)
  • 1
    • 4944260197 scopus 로고    scopus 로고
    • Measurement of solar cell parameters using time domain technique
    • Deshmukh, M.P., 2004. Measurement of solar cell parameters using time domain technique. Review of Scientific Instruments 75 (8).
    • (2004) Review of Scientific Instruments , vol.75 , Issue.8
    • Deshmukh, M.P.1
  • 2
    • 0019624188 scopus 로고
    • Depletion layer effects in the open circuit voltage decay lifetime measurement
    • Mahan, J.E., Barnes, D.L., 1981. Depletion layer effects in the open circuit voltage decay lifetime measurement. Solid State Electronics 24 (10), 989-994.
    • (1981) Solid State Electronics , vol.24 , Issue.10 , pp. 989-994
    • Mahan, J.E.1    Barnes, D.L.2
  • 3
    • 0018467981 scopus 로고
    • Measurement of Minority carrier lifetime in solar cells from photo-induced open circuit voltage decay
    • Mahan, J.E., Ekstedst, T.W., Frank, R.I., Kalpow, R., 1979. Measurement of Minority carrier lifetime in solar cells from photo-induced open circuit voltage decay. IEEE Transactions on Electron devices 26 (5), 733-739.
    • (1979) IEEE Transactions on Electron Devices , vol.26 , Issue.5 , pp. 733-739
    • Mahan, J.E.1    Ekstedst, T.W.2    Frank, R.I.3    Kalpow, R.4
  • 5
    • 0019243927 scopus 로고
    • Carrier lifetime in Photovoltaic Solar concentrator cells by the smallsignal open-circuit decay
    • Moore, A.R., 1980. Carrier lifetime in Photovoltaic Solar concentrator cells by the smallsignal open-circuit decay. RCA Review 40, 549-562.
    • (1980) RCA Review , vol.40 , pp. 549-562
    • Moore, A.R.1
  • 6
    • 0018434905 scopus 로고
    • A better approach to the evaluation of the series resistance of Solar cell
    • Rajakanan, K., Shewchun, J., 1979. A better approach to the evaluation of the series resistance of Solar cell. Solid State Electronics 22, 193-197.
    • (1979) Solid State Electronics , vol.22 , pp. 193-197
    • Rajakanan, K.1    Shewchun, J.2
  • 7
    • 0026853375 scopus 로고
    • Determination of solar cell diffusion capacitance and its dependence on temperature and 1 MeV electron fluence level
    • Sharma, S.K., Pavithra, D., Sivakumar, Shinivasmurthy, N., Agrawal, B.L., 1992. Determination of solar cell diffusion capacitance and its dependence on temperature and 1 MeV electron fluence level. Solar Energy Materials and Solar Cells 26, 169-179.
    • (1992) Solar Energy Materials and Solar Cells , vol.26 , pp. 169-179
    • Sharma, S.K.1    Pavithra, D.2    Sivakumar3    Shinivasmurthy, N.4    Agrawal, B.L.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.