Micromechanics of residual stress and texture development due to poling in polycrystalline ferroelectric ceramics

Journal of the Mechanics and Physics of Solids

Volumn 53, Issue 2, 2005, Pages 249-260

  Hall, D A ^a   Steuwer, A ^a,b   Cherdhirunkorn, B ^a   Withers, P J ^a   Mori, T ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Domain conversion; Ferroelectric ceramic; Residual stress; Synchrotron x ray diffraction; Texture development

Indexed keywords

COMPOSITE MICROMECHANICS; DATA REDUCTION; FUNCTIONS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; STRAIN; TEXTURES; X RAY DIFFRACTION ANALYSIS;

DOMAIN CONVERSION; ELASTIC STRAIN; SYNCHROTON X-RAY DIFFRACTION; TEXTURE DEVELOPMENT;

FERROELECTRIC MATERIALS;

EID: 10844281041     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2004.07.002     Document Type: Article

References (13)

1. Endriss, A., Hammer, M., Hoffmann, M.J., Kolleck, A., Schneider, G.A., 1999. J. Eur. Ceram. Soc. 19, 1229.
2. Eshelby, J.D., 1957. Proc. R. Soc. A 241, 376.
3. Guo, R., Cross, L.E., Park, S-E., Noheda, B., Cox, D.E., Shirane, G., 2000. Phys. Rev. Lett. 84, 5423.
4. Hall, D.A., Steuwer, A., Cherdhirunkorn, B., Withers, P.J., Mori, T., 2004. J. Appl. Phys., in press.
5. Huber, J.E., Fleck, N.A., 2001. J. Mech. Phys. Solids 49, 785.
6. Huber, J.E., Fleck, N.A., 2004. Eur. J. Mech. A/Solids 23, 203.
7. Huber, J.E., Fleck, N.A., Landis, C.M., McMeeking, R.M., 1999. J. Mech. Phys. Solids 47, 1663.
8. Hutchinson, J.W., 1964. J. Mech. Phys. Solids 12, 11.
9. Hwang, S.C., McMeeking, R.M., 1999. Int. J. Solids Struct. 36, 1541.
10. Li, W.F., Weng, G.J., 1999. Proc. R. Soc. A 455, 3493.
11. McMeeking, R.M., Landis, C.M., 2002. Int. J. Eng. Sci. 40, 1553.
12. Mura, T., 1987. Micromechanics of Defects in Solids. Martinus Nijhoff, Dordrecht.
13. Reszat, J-T., Glazounov, A.E., Hoffmann, M.J., 2001. J. Eur. Ceram. Soc. 21, 1229.