Light and electron microscopy studies on highly deformed nickel with a submicrocrystalline structure;Licht- Und elektronenmikroskopische Untersuchung an hochverformtem Nickel mit submikrokristallinem Gefüge

Praktische Metallographie/Practical Metallography

Volumn 41, Issue 12, 2004, Pages 589-609

  Blank, C ^a   Kopylov, V I ^b   Schneider, M ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b Physikalisch Technisches Institut   (Ukraine)

^c FRAUNHOFER INSTITUTE FOR MANUFACTURING TECHNOLOGY AND ADVANCED MATERIALS IFAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EQUAL CHANNEL ANGULAR PRESSING (ECAP); GRAIN REFINEMENT; METALLIC MATERIALS; HARDNESS MEASUREMENT; INNOVATIVE TECHNIQUES; METALLIC MATERIAL; SEVERE PLASTIC DEFORMATIONS; SUBMICROCRYSTALLINE; SUBMICROCRYSTALLINE STRUCTURES; TEM SAMPLE PREPARATION;

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; PLASTIC DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY; EQUAL CHANNEL ANGULAR PRESSING; GRAIN REFINEMENT; GRAIN SIZE AND SHAPE; LIGHT TRANSMISSION; NICKEL; PLASTICS INDUSTRY; PRESSING (FORMING);

NICKEL; NICKEL METALLOGRAPHY;

EID: 10844261868     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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