-
1
-
-
0026118659
-
High-Tc thin films on low microwave loss alkalíne-rare-earth- aluminate crystals
-
R. Sobolewski, F. Gierlowski, W. Kula, S. Zarembinski, S. J. Lewandowski, M. Berkowski, A. Pajaczkowska, B. P. Gorshunov, D. B. Lyudmirsk, and O. I. Sirotinski, "High-Tc Thin Films on Low Microwave Loss Alkalíne-Rare- Earth-Aluminate Crystals," IEEE Trans. Magn., 27 [2] 876-79 (1991).
-
(1991)
IEEE Trans. Magn.
, vol.27
, Issue.2
, pp. 876-879
-
-
Sobolewski, R.1
Gierlowski, F.2
Kula, W.3
Zarembinski, S.4
Lewandowski, S.J.5
Berkowski, M.6
Pajaczkowska, A.7
Gorshunov, B.P.8
Lyudmirsk, D.B.9
Sirotinski, O.I.10
-
2
-
-
0009987357
-
Low-loss substrate for microwave application of high-temperature superconductor films
-
R. Brown, V. Pendrick, D. Kalokitis, and B. H. T. Chai, "Low-Loss Substrate for Microwave Application of High-Temperature Superconductor Films," Appl. Phys. Lett., 57 [13] 1351-53 (1990).
-
(1990)
Appl. Phys. Lett.
, vol.57
, Issue.13
, pp. 1351-1353
-
-
Brown, R.1
Pendrick, V.2
Kalokitis, D.3
Chai, B.H.T.4
-
3
-
-
0027556441
-
Anomalies in crystal growth by czochralski technique
-
A. Pajaczkowska and P. Byszewski, "Anomalies in Crystal Growth by Czochralski Technique," J. Cryst. Growth, 12 [1-4] 694-98 (1993).
-
(1993)
J. Cryst. Growth
, vol.12
, Issue.1-4
, pp. 694-698
-
-
Pajaczkowska, A.1
Byszewski, P.2
-
4
-
-
0002428169
-
4, and deviations from the oxide additivity rule
-
4, and Deviations from the Oxide Additivity Rule," J. Solid State Chem., 98, 90-98 (1992).
-
(1992)
J. Solid State Chem.
, vol.98
, pp. 90-98
-
-
Shannon, R.D.1
Oswald, R.A.2
Parise, J.B.3
Chai, B.H.T.4
Byizewski, P.5
Pajaczkowska, A.6
Sobolewski, R.7
-
8
-
-
0031547460
-
4 single crystals having possible HTSC substrate applications
-
4 Single Crystals Having Possible HTSC Substrate Applications," J. Cryst. Growth. 174, 324-27 (1997).
-
(1997)
J. Cryst. Growth.
, vol.174
, pp. 324-327
-
-
Erdei, S.1
McNeal, M.2
Jang, S.J.3
Cross, L.E.4
Bhalla, A.S.5
Ainger, F.W.6
Dabkowski, A.7
Dabkowska, H.A.8
-
9
-
-
0031125077
-
4 solid solutions: New promising substrate materials for HTSc
-
4 Solid Solutions: New Promising Substrate Materials for HTSc," J. Alloys Compd., 25, 1-6 (1997).
-
(1997)
J. Alloys Compd.
, vol.25
, pp. 1-6
-
-
Berkowski, M.1
-
13
-
-
0032624361
-
Microwave dielectric properties and applications of rare-earth aluminates
-
S. Y. Cho, I. T. Kim, and K. S. Hong. "Microwave Dielectric Properties and Applications of Rare-Earth Aluminates," J. Mater. Res., 14, 114-19 (1999).
-
(1999)
J. Mater. Res.
, vol.14
, pp. 114-119
-
-
Cho, S.Y.1
Kim, I.T.2
Hong, K.S.3
-
16
-
-
84928809109
-
A dielectric resonant method of measuring inductive capacitance in the millimeter range
-
B. W. Hakki and P. D. Coleman, "A Dielectric Resonant Method of Measuring Inductive Capacitance in the Millimeter Range," IRE Trans. Microwave Theory Tech., 8, 402-10 (1960).
-
(1960)
IRE Trans. Microwave Theory Tech.
, vol.8
, pp. 402-410
-
-
Hakki, B.W.1
Coleman, P.D.2
-
17
-
-
0019530308
-
Local complex permittivity measurement of MIC substrates
-
J. DelaBalle, P. Guillon, and Y. Garault, "Local Complex Permittivity Measurement of MIC Substrates," AEU, Electron. Commun., 35, 80-83 (1981).
-
(1981)
AEU, Electron. Commun.
, vol.35
, pp. 80-83
-
-
Delaballe, J.1
Guillon, P.2
Garault, Y.3
-
18
-
-
0014829002
-
Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators
-
W. E. Courtney, "Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeability of Microwave Insulators," IEEE Trans. Microwave Theory Tech., MTT-18, 476-85 (1960).
-
(1960)
IEEE Trans. Microwave Theory Tech.
, vol.MTT-18
, pp. 476-485
-
-
Courtney, W.E.1
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