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Volumn 87, Issue 11, 2004, Pages 2143-2146

Microstructures and microwave dielectric characteristics of CaRAlO 4 (R = Nd, Sm, Y) ceramics with tetragonal K2NiF 4 structure

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CALCIUM COMPOUNDS; DIELECTRIC PROPERTIES; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; ETCHING; MICROSTRUCTURE; MICROWAVES; POTASSIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY POWDER DIFFRACTION;

EID: 10844261844     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2004.tb06373.x     Document Type: Article
Times cited : (74)

References (18)
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    • A. Pajaczkowska and P. Byszewski, "Anomalies in Crystal Growth by Czochralski Technique," J. Cryst. Growth, 12 [1-4] 694-98 (1993).
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    • 4 Solid Solutions: New Promising Substrate Materials for HTSc," J. Alloys Compd., 25, 1-6 (1997).
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    • Berkowski, M.1
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    • Microwave dielectric properties and applications of rare-earth aluminates
    • S. Y. Cho, I. T. Kim, and K. S. Hong. "Microwave Dielectric Properties and Applications of Rare-Earth Aluminates," J. Mater. Res., 14, 114-19 (1999).
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    • Cho, S.Y.1    Kim, I.T.2    Hong, K.S.3
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    • A dielectric resonant method of measuring inductive capacitance in the millimeter range
    • B. W. Hakki and P. D. Coleman, "A Dielectric Resonant Method of Measuring Inductive Capacitance in the Millimeter Range," IRE Trans. Microwave Theory Tech., 8, 402-10 (1960).
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    • Hakki, B.W.1    Coleman, P.D.2
  • 17
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    • Local complex permittivity measurement of MIC substrates
    • J. DelaBalle, P. Guillon, and Y. Garault, "Local Complex Permittivity Measurement of MIC Substrates," AEU, Electron. Commun., 35, 80-83 (1981).
    • (1981) AEU, Electron. Commun. , vol.35 , pp. 80-83
    • Delaballe, J.1    Guillon, P.2    Garault, Y.3
  • 18
    • 0014829002 scopus 로고
    • Analysis and evaluation of a method of measuring the complex permittivity and permeability of microwave insulators
    • W. E. Courtney, "Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeability of Microwave Insulators," IEEE Trans. Microwave Theory Tech., MTT-18, 476-85 (1960).
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    • Courtney, W.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.