Degradation study of a photographic developer to determine shelf life

Quality Engineering

Volumn 10, Issue 1, 1997, Pages 137-140

  Chapman, Robert E ^a,b  

^a EASTERN MICHIGAN UNIVERSITY   (United States)

^b ASQ   (United States)

Author keywords

Arrhenius study; Degradation failure mode; Reliability; Shelf life

Indexed keywords

EID: 10844261756     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1080/08982119708919116     Document Type: Article

References (7)

1. Labuza, T. P., Shelf-life Dating of Food, Food & Nutrition Press, Westport, CT, 1982.
2. Beal, S. L. and Sheiner, L. B., Methodology of Population Pharmacokinetics, in Drug Fate and Metabolism: Methods and Techniques, edited by E. R. Garrett and J. L. Hirtz, Marcel Dekker, Inc., New York, 1985, Vol. 5, pp. 135-183.
3. Howes, M. J. and Morgan, D. V. (eds.), Reliability and Degradation - Semiconductor Devices and Circuits, John Wiley and Sons, New York, 1981, Vol. 6.
4. Tseng, S., Hamada, M., and Chiao, C., J. Qual. Technol., 27, 363 (1995).
5. Nelson, W., Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley and Sons, New York, 1990.
6. Lu, C. J. and Meeker, W. Q., Technometrics, 35, 161 (1993).
7. Tobias, P. A. and Trindale, D. C., Applied Reliability, 2nd ed., Van Nostrand Reinhold, New York, 1995, p. 149.