Texture evolution during the processing of electrical steels with 0.5% Si and 1.25% Si

ISIJ International

Volumn 44, Issue 10, 2004, Pages 1733-1737

  De Campos, Marcos F ^a   Landgraf, Fernando J G ^b   Falleiros, Ivan G S ^c   Fronzaglia, Gabriela C ^c   Kahn, Henrique ^c  

^a FLUMINENSE FEDERAL UNIVERSITY   (Brazil)

^b Instituto de Pesquisas Tecnologicas   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Electrical steels; Recrystallization; Texture

Indexed keywords

ANNEALING; COLD ROLLING; COMPOSITION; CRYSTALLOGRAPHY; RECRYSTALLIZATION (METALLURGY); SILICON; TEXTURES; X RAY DIFFRACTION ANALYSIS;

COLD REDUCTION; ELECTRICAL STEELS; SKIN PASS; TEXTURE EVOLUTION;

STEEL;

EID: 10844256771     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.44.1733     Document Type: Article

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